Frederic Houze

Laboratoire

Génie Électrique et Électronique de PariS

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Publications (141)

Article dans une revue 01/01/2005

Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode

Frédéric Houzé , Pascal Chrétien , Olivier Schneegans , René Meyer , Lionel Boyer , Frederic Houze , Olivier Schneegans

Communication dans un congrès 01/01/2005

Simultaneous resistance and capacitance cartography by conducting probe AFM in contact mode

Pascal Chrétien , Frédéric Houzé , Olivier Schneegans , René Meyer , Lionel Boyer , Frederic Houze , Olivier Schneegans

Communication dans un congrès 01/01/2005

Caractérisation de profils de dopage par imagerie de résistance locale à faible force

Frédéric Houzé , D. Mariolle , F. Bertin , Pascal Chrétien , Olivier Schneegans , Frederic Houze , Olivier Schneegans

Communication dans un congrès 01/01/2005

Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

Frédéric Houzé , José Alvarez , Jean-Paul Kleider , P. Bergonzo , E. Snidero , D. Tromson , Frederic Houze , Jose Alvarez , Jean-Paul Kleider

Communication dans un congrès 01/01/2005

Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

Frédéric Houzé , José Alvarez , Jean-Paul Kleider , P. Bergonzo , E. Snidero , D. Tromson , Frederic Houze , Jose Alvarez , Jean-Paul Kleider

Communication dans un congrès 01/01/2005

Fabrication of high-Tc superconducting hot electron bolometers for terahertz mixer applications

J.C. Villégier , Annick Dégardin , B. Guillet , Frédéric Houzé , Alain Kreisler , M. Chaubet , Frederic Houze , Alain Kreisler

Communication dans un congrès 01/01/2005

Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

Frédéric Houzé , José Alvarez , Jean-Paul Kleider , P. Bergonzo , E. Snidero , D. Tromson , Frederic Houze , Jose Alvarez , Jean-Paul Kleider

Communication dans un congrès 01/01/2004

Simultaneous height, resistance and capacitance cartography of a SRAM test sample by conducting probe AFM

Pascal Chrétien , Olivier Schneegans , Frédéric Houzé , René Meyer , Lionel Boyer , Olivier Schneegans , Frederic Houze

Article dans une revue 01/01/2002

“ Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy

Olivier Schneegans , Lionel Boyer , Frédéric Houzé , René Meyer , Pascal Chrétien , Olivier Schneegans , Frederic Houze

Article dans une revue 01/01/1996

Bulk and surface structural properties of Si$_{1-x-y}$Ge$_x$C$_y$ layers processed on Si(001) by pulsed laser induced epitaxy

C. Guedj , J. Boulmer , D. Bouchier , C. Clerc , G. Calvarin , C. Godet , Pere Roca I Cabarrocas , F. Houze , D. Mencaraglia , Frederic Houze , Denis Mencaraglia